Scanning Electron Microscopy, or SEM analysis, is a powerful analytical tool which uses a focused beam of electrons to produce intricate, high magnification images of a sample’s surface topography.
This high resolution imaging is useful for analyzing the surface condition of a variety of materials, and for evaluating samples for surface fractures, flaws, contaminants, or a corrosive presence. Combined with Energy-Dispersive X-Ray Spectroscopy (EDS), SEM analysis offers chemical composition and elemental analysis – providing a comprehensive metallurgical evaluation.
SEM analysis is also utilized for particle characterization, such as wear debris generated during mechanical wear testing. The high magnification, high-resolution imaging of an SEM analysis supports the determination of the number, size, and morphology of small particles, allowing clients to better understand the wear properties of their material.
Typical uses of Scanning Electron Microscopy include:
- Contaminant & Residue Analysis
- Critical Dimensional Measurement
- Failure Analysis & Investigation
- Particle Analysis (in support of wear testing)
- Surface Flaw/Defect Analysis
Element’s knowledgeable scientists and metallurgists have critical expertise across a wide range of industries, including aerospace, transportation, petrochemical, industrial and metal manufacturing. This expertise allows our Engaged Experts to provide you with the necessary insights and interpretation to implement process or procedure improvements.
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